CSI test probes are engineered with exacting tolerances for proper fit and ease of operation with their mating socket. In all cases the test probe contacts are designed to simulate the IC leads, and contact the socket just as the device would. CSI test probes can be custom manufactured for virtually any socket type regardless of pin count and pitch.
CSI test probes use the highest quality materials from plastics to probe head contacts, with Precise and quality driven manufacturing processes to ensure a quality product. All our probe head contacts are constructed from fully hardened Beryllium-Copper, with hard Gold plating to combine rigidity, low resistance and long life. |
